Personnel
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Dutchak Yaroslav Yosypovych - for 70 year from birthday
(.pdf, 119kb)
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399
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Physical-Mathematical Sciences
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Research electrical and
optical behaviour Barriers Shottki
In/p-CuInSe2
Z.D. Kovalyuk, V.B. Orletskyy, O.M. Sydor, V.V. Netyaga |
401 |
Formation of Multilayer
Structures on the Silicon Surface after Etching in Plasma
Z. Rutkuniene, A. Grigonis, A. Reza, J.G. Babonas, A. Jotautis |
407 |
The Structure and the
Conductivity of Thin Films REM-Me-SC by Electron Bombardment
and Gamma Rays
G.S. Bajtzar, O.G. Mikolajchuk, B.P. Yatsyshyn |
414 |
Electric Conductivity of
Nd:KGd(WO4)2 Crystals at Direct and
Alternating Current
B. Andriyevsky, A. Patryn |
420 |
The Influence of the Impurity
Defects Type on the Structural Properties of the Zinc Selenium
Layers
V.P. Makhniy, M.D. Raransky, A.M. Slyotov, I.V.Tkachenko |
426 |
Thermal-Electrical Properties
and Defect Subsystem of Lead Telluride - Caesium Iodide Solid
Solution
R.Ja. Mykhajljonka, V.M. Klanichka, V.M. Shperun, V.I. Potyak |
430 |
Pulsed Laser Deposition of
ZrO2 Thin Films for Application in Microelectronic
Devices
B.K. Kotlyarchuk, D.I. Popovych, V.K. Savchuk, A.S. Serednycki |
434 |
The Influence of Thickness
Fluctuations on Conductivity of a Quantum Semiconducting Wire
M.A. Ruvinskii, B.K. Ostafiychuk, B.M. Ruvinskii |
440 |
The Work Function of
Polyaniline Thin Films
E.P. Koval'chuk, Z.V. Stasyuk, M.M. Kozak |
444 |
The X-ray Investigation of
Surface Layers of Monocrystalline YIG Implanted by the
B +
Ions
I.P. Yaremiy |
448 |
Close-Mouthed Thermal-Electrical
Currents and Transverse Thermal-E.M.F. on Electric-Isolation
Band- Heterogeneous Environment
V.G. Okhrem, А.А. Ascheulov, О.А. Okhrem |
453 |
To a Problem on the Nature
and Mechanisms of Intercalation Process
I.I. Grigorchak |
458 |
Influencing Intercalation by
a Molecular Fluorine і by Hydrogen on Properties to Laminated
Talcum
I.I. Grigorchak |
462 |
Structural Properties of Films
of Oxides of Tin and Zincum
І.М. Chernenko, К.V. Chasovskyy, Yu.S. Tarasenko |
466 |
Nitrogen as Annihilation Centre
for Point Defects in Implanted Silicon
A.R. Chelyadinskii, V.Yu. Yavid, S.N. Jakubenja, P. Zukowski |
470 |
Degradation of AlxGa1-xAs/GaAs
Co60 g-Ray Irradiated Heterostructures
P.G. Litovchenko, V.P. Tartachnyk, V.Ya. Opilat, S. Kanevsky,
I.V.Petrenko, O.P.Shahov, R.K.Savkina, A.B.Smirnov, S.I.Krukovsky |
474 |
The Thermodynamic Regularities
and Kinetic of Lithium Electrochemical Interstition into Zeolite
Structures
B.P. Bahmatyuk, R.V. Ilnytskyy, V.I. Mandzyuk, I.F. Myronyuk,
B.K. Ostafiychuk |
481 |
Magnitoresistance
Ge-Si Whiskers
A.A. Druzhinin, I.P. Ostrovskii, N.S. Liakh |
485 |
Modeling of physical properties
and experimental results for virtual p-i-n diode based on
metal-insulator-silicon structure
Oleksandr Malik, Volodymyr Grimalsky |
491 |
Structure and Electronic
Properties of K-Phase
V.A. Andryushchenko, L.V. Bekenov, V.N. Antonov |
498 |
eity of Chemical Composition
and Electrical Parameters on Lead Sulphide Thin Films with Oxygen
І.V. Kalytchuk |
505 |
Amphoteric Behaviour of Bismuth on
Doping PbSe<Se>:Bi Films
А.М. Yatsura |
510 |
Chemical Sciences
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Impurity-Defect Subsystem of
Blende Structure onCadmium Telluride Crystals, Doped by Chlorine
L.Y. Mezhylovska, A.M. Dmytriv, M.V. Lopjanko |
515 |
Use of Phase Modifiers for
Improvement of Activity of Co-Cr Catalysts in the Process of
Oxidation of Gaseous Hydrocarbons
L.T. Strutynska, V.Ya. Mikhailovsky |
521 |
oncept оf the Compositional
Atmosphere Resistance and Priority Methods of Polymers
Photoutilization
I.M. Smolenskiy |
526 |
System Ag-Sn-Se. The
Peculiarities of Structure Т-х Space
V.M. Moroz, А.І. Schurok, О.G. Мykolaychuk, М.V. Byalyk, V.F. Оrlenkо,
D.І. Оleksyn, М.В. Мoroz |
532 |
Physical-Chemical Properties
and Atomic Defects on Lead Telluride Crystaks, Doped by Thallium
D.M. Freik, V.M. Boychuk, G.D. Mateik |
536 |
Solubility of GaSb in the Solutions of the
H2O2-HCl-CH3COOH System
V.M. Tomashik, O.S. Chernyuk, V.I. Grytsiv, Z.F. Tomashik, N.V. Kusyak |
543 |
Atomic Defects and Their Compensation on Pure
and Doped Cadmium Telluride
D.М. Freik, V.V. Prokopiv, U.М. Pysklynetsj |
547 |
Technical Sciences
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Structure Changes Caused
by the Laser Pulse in Ge Subsurface Layer
V. Nadtochy, M. Golodenko, A. Kalimbet, D. Moskal
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556
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Microstructure and
properties of Cu-doped Nd-Fe-B-C ingot magnets
E. Vasilyeva, V. Vystavkina |
560 |
Design-Technological
Peculiarities of Submicron Structures Forming of Address
Circuits Memory
S.P. Novosyadlyy, R.I. Zapuchlyak |
568 |
Cavitational Resistance
Of Non-Metal Constructional Materials
Y.G Sukhenko, A.A. Litvinenko, A.I. Nekoz, V.Y. Sukhenko |
583 |
Computer Model Operation of Structure
Formation at a Metals Сrystallization
O.M. Doniy, А.А. Кulinich, O.M. Yanov, O.O. Rjabinina |
585 |
Investigation of the Carbonate
Location in the Bone Tissue Mineral by X-ray Diffraction and
Temperature-programmed Desorption Mass Spectrometry
S. Danilchenko, V. Pokrovskiy, V. Bogatyr'ov, L.Sukhodub, B.
Sulkio-Cllef |
589 |
The Analysis of Restriction
on Used of Frequency Signal Modulation on Optoelectronic Systems
of the Destructive Monitoring
І.М. Maslov |
596 |